Rolain, YvesYvesRolainVan Moer, WendyWendyVan MoerSchoukens, JohanJohanSchoukensVandersteen, GerdGerdVandersteen2021-10-152021-10-152004-06https://imec-publications.be/handle/20.500.12860/9525Why are nonlinear microwave systems measurements so involved?Journal article