Gao, ZhanZhanGaoMalagi, SantoshSantoshMalagiMarinissen, Erik JanErik JanMarinissenSwenton, JoeJoeSwentonHuisken, JosJosHuiskenGoossens, KeesKeesGoossens2021-10-272021-10-272019-03https://imec-publications.be/handle/20.500.12860/33012Defect-location identification for cell-aware testProceedings paperhttps://ieeexplore.ieee.org/document/8704561