Reliability engineering enabling continued logic for memory device scaling

O'Sullivan, BarryBarryO'SullivanRitzenthaler, RomainRomainRitzenthalerDentoni Litta, EugenioEugenioDentoni LittaSimoen, EddyEddySimoenMachkaoutsan, VladimirVladimirMachkaoutsanFazan, PierrePierreFazanJi, YunhyuckYunhyuckJiKim, CheolgyuCheolgyuKimSpessot, AlessioAlessioSpessotLinten, DimitriDimitriLintenHoriguchi, NaotoNaotoHoriguchi2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33712Reliability engineering enabling continued logic for memory device scalingProceedings paperhttps://ieeexplore.ieee.org/document/8989891