Impact of CMOS Scaling and Technology Options on ESD Reliability

Mahadeva Iyer, NatarajanNatarajanMahadeva IyerThijs, StevenStevenThijsVassilev, VesselinVesselinVassilevTremouilles, DavidDavidTremouillesLinten, DimitriDimitriLintenGroeseneken, GuidoGuidoGroeseneken2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10834Impact of CMOS Scaling and Technology Options on ESD ReliabilityOral presentation