Fundamental understanding of NBTI degradation mechanism in IGZO channel devices

Zhao, YingYingZhaoRinaudo, PietroPietroRinaudoVaisman Chasin, AdrianAdrianVaisman ChasinTruijen, BrechtBrechtTruijenKaczer, BenBenKaczerRassoul, NouredineNouredineRassoulDekkers, HaroldHaroldDekkersBelmonte, AttilioAttilioBelmonteDe Wolf, IngridIngridDe WolfKar, Gouri SankarGouri SankarKarFranco, JacopoJacopoFranco2024-09-192024-08-162024-09-192024979-8-3503-6977-91541-7026WOS:001229691100032https://imec-publications.be/handle/20.500.12860/44320Fundamental understanding of NBTI degradation mechanism in IGZO channel devicesProceedings paper10.1109/IRPS48228.2024.10529352979-8-3503-6976-2WOS:001229691100032