Roussel, PhilippePhilippeRousselCiofi, IvanIvanCiofiDegraeve, RobinRobinDegraeveVega Gonzalez, VictorVictorVega GonzalezJourdan, NicolasNicolasJourdanBaert, RogierRogierBaertLinten, DimitriDimitriLintenBoemmels, JuergenJuergenBoemmelsTokei, ZsoltZsoltTokeiGroeseneken, GuidoGuidoGroesenekenThean, AaronAaronThean2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27245Semi-empirical interconnect resistance model for advanced technology nodesProceedings paper