Acharya, Lomash ChandraLomash ChandraAcharyaSharma, ArvindArvindSharmaMishra, NeerajNeerajMishraSingh, Khoirom JohnsonKhoirom JohnsonSinghDargupally, MahipalMahipalDargupallyGupta, NehaNehaGuptaShabarish, Nayakanti SaiNayakanti SaiShabarishMandal, AjoyAjoyMandalRamakrishnan, VenkatramanVenkatramanRamakrishnanDasgupta, SudebSudebDasguptaBulusu, AnandAnandBulusu2025-04-302024-12-032025-04-3020240278-0070WOS:001362238800040https://imec-publications.be/handle/20.500.12860/44910Switching Activity Factor-Based ECSM Characterization (SAFE): A Novel Technique for Aging-Aware Static Timing AnalysisJournal article10.1109/TCAD.2024.3396432WOS:001362238800040CMOS INVERTERDESIGNNBTIMODELTEMPERATURERELIABILITYCIRCUITS