Contactless electroreflectance evidence for reduction in the surface potential barrier in AlGaN/GaN heterostructures passivated by SiN layer

Kudrawiec, RobertRobertKudrawiecPaszkiewicz, B.B.PaszkiewiczMotyka, M.M.MotykaMisciewic, JanJanMisciewicDerluyn, JoffJoffDerluynLorenz, AnneAnneLorenzCheng, KaiKaiChengDas, JoJoDasGermain, MarianneMarianneGermain2021-10-172021-10-172008-110021-8979https://imec-publications.be/handle/20.500.12860/13966Contactless electroreflectance evidence for reduction in the surface potential barrier in AlGaN/GaN heterostructures passivated by SiN layerJournal article