Farvacque, J. L.J. L.FarvacqueBougrioua, ZahiaZahiaBougriouaMoerman, IngridIngridMoerman2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4365Theoretical simulation of free carrier mobility collapse in GaN in terms of dislocation wallsJournal article