Vanhoenacker, K.K.VanhoenackerSchoukens, J.J.SchoukensGuillaume, P.P.GuillaumeVanlanduit, S.S.Vanlanduit2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9833The use of multisine excitations to characterize damage in structuresJournal article