On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETs

Simoen, EddyEddySimoenClaeys, CorCorClaeysChung, T.M.T.M.ChungFlandre, D.D.FlandreRaskin, J.P.J.P.Raskin2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12904On the origin of the excess low-frequency noise in graded-channel silicon-on-insulator nMOSFETsJournal article