Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET Nodes

Tondelli, L.L.TondelliAsanovski, RubenRubenAsanovskiScholten, A. J.A. J.ScholtenDinh, T. V.T. V.DinhTam, S. -W.S. -W.TamPijper, R. M. T.R. M. T.PijperSelmi, L.L.Selmi2025-07-102024-10-262025-07-1020240018-9383WOS:001336024700001https://imec-publications.be/handle/20.500.12860/44684Understanding the Self-Heating Effects Measured With the AC Output Conductance Method in Advanced FinFET NodesJournal article10.1109/TED.2024.3469187WOS:001336024700001EXTRACTIONALGAN/GANDEVICES