Boubaaya, MohamedMohamedBoubaayaO'Sullivan, BarryBarryO'SullivanFranco, JacopoJacopoFrancoDentoni Litta, EugenioEugenioDentoni LittaRitzenthaler, RomainRomainRitzenthalerDupuy, EmmanuelEmmanuelDupuyMachkaoutsan, VladimirVladimirMachkaoutsanFazan, PierrePierreFazanCheolgyu Kim, CheolgyuCheolgyuCheolgyu KimSpessot, AlessioAlessioSpessotLinten, DimitriDimitriLintenHoriguchi, NaotoNaotoHoriguchi2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32602Impact of fin height on bias temperature instability of memory periphery FinFETsProceedings paperhttps://ieeexplore.ieee.org/document/8989914