Oliveira, AlbertoAlbertoOliveiraArimura, HiroakiHiroakiArimuraBoccardi, GuillaumeGuillaumeBoccardiCollaert, NadineNadineCollaertClaeys, CorCorClaeysHoriguchi, NaotoNaotoHoriguchiSimoen, EddyEddySimoen2021-10-292021-10-2920200018-9383https://imec-publications.be/handle/20.500.12860/35669Low-frequency noise characterization of germanium n-channel finFETsJournal article10.1109/TED.2020.2990714