Ni, KaiKaiNiEneman, GeertGeertEnemanSimoen, EddyEddySimoenMocuta, AndaAndaMocutaCollaert, NadineNadineCollaertThean, AaronAaronTheanSchrimpf, RonaldRonaldSchrimpfReed, RobertRobertReedFleetwood, DanielDanielFleetwood2021-10-232021-10-2320160018-9383https://imec-publications.be/handle/20.500.12860/27075Electrical effect of a single extended defect in MOSFETs: a simulation studyJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7506283