Quantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffraction

Liu, ZiyangZiyangLiuMerckling, ClementClementMercklingCaymax, MattyMattyCaymaxRooyackers, RitaRitaRooyackersCollaert, NadineNadineCollaertThean, AaronAaronTheanRichard, OlivierOlivierRichardBender, HugoHugoBenderVandervorst, WilfriedWilfriedVandervorstHeyns, MarcMarcHeyns2021-10-222021-10-222015-061528-7483https://imec-publications.be/handle/20.500.12860/25570Quantitative method to determine planar defect frequency in InAs nanowires by high resolution X-ray diffractionJournal articlehttp://pubs.acs.org/doi/abs/10.1021/acs.cgd.5b00489