Effect of sample preparation techniques upon single cell chemical imaging: A practical comparison between synchrotron radiation based X-ray fluorescence (SR-XRF) and Nanoscopic Secondary Ion Mass Spectrometry (nano-SIMS)

De Samber, BjornBjornDe SamberDe Rycke, RietRietDe RyckeDe Bruyne, MichielMichielDe BruyneKienhuis, MichielMichielKienhuisSandblad, LindaLindaSandbladBohic, SylvainSylvainBohicCloetens, PeterPeterCloetensUrban, ConstantinConstantinUrbanPolerecky, LubosLubosPolereckyVincze, LaszloLaszloVincze2021-10-282021-10-282020-040003-2670https://imec-publications.be/handle/20.500.12860/34998Effect of sample preparation techniques upon single cell chemical imaging: A practical comparison between synchrotron radiation based X-ray fluorescence (SR-XRF) and Nanoscopic Secondary Ion Mass Spectrometry (nano-SIMS)Journal article10.1016/j.aca.2020.01.054