Breakdown investigation in GaN-based MIS-HEMT devices

Marino, FabioFabioMarinoBisi, DavideDavideBisiMeneghini, MatteoMatteoMeneghiniVerzellesi, GiovanniGiovanniVerzellesiZanoni, EnricoEnricoZanoniVan Hove, MarleenMarleenVan HoveYou, ShuzhenShuzhenYouDecoutere, StefaanStefaanDecoutereMarcon, DenisDenisMarconStoffels, SteveSteveStoffelsRonchi, NicoloNicoloRonchiMeneghesso, GaudioGaudioMeneghesso2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24210Breakdown investigation in GaN-based MIS-HEMT devicesProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6948839