Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy

Lagrain, PieterPieterLagrainPaulussen, KrisKrisPaulussenGrieten, EvaEvaGrietenVan den Bosch, GeertGeertVan den BoschRachidi, SanaSanaRachidiYudistira, DiditDiditYudistiraWouters, LennaertLennaertWoutersHantschel, ThomasThomasHantschel2025-07-162024-08-172025-07-1620242590-0072WOS:001289216200001https://imec-publications.be/handle/20.500.12860/44343Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopyJournal article10.1016/j.mne.2024.100247WOS:001289216200001SPECIMENS