Vinicius de Oliveira, AlbertoAlbertoVinicius de OliveiraAgopian, G.D.G.D.AgopianMartino, J.J.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeysMertens, HansHansMertensCollaert, NadineNadineCollaertThean, AaronAaronThean2021-10-232021-10-2320161807-1953https://imec-publications.be/handle/20.500.12860/27550Impact of gate stack layer composition on dynamic threshold voltage and analog parameters of Ge pMOSFETsJournal article