Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor

Amrouch, HussamHussamAmrouchvan Santen, Victor M.Victor M.van SantenDiaz Fortuny, JavierJavierDiaz FortunyKlemme, FlorianFlorianKlemme2024-08-162024-08-162024979-8-3503-6977-91541-7026WOS:001229691100064https://imec-publications.be/handle/20.500.12860/44332Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full ProcessorProceedings paper10.1109/IRPS48228.2024.10529386979-8-3503-6976-2WOS:001229691100064IMPACTVARIABILITYRELIABILITYPERFORMANCEDEGRADATIONRECOVERYDEVICE