Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures

Michl, J.J.MichlGrasser, T.T.GrasserWaltl, M.M.WaltlGrill, AlexanderAlexanderGrillBury, ErikErikBuryTyaginov, StanislavStanislavTyaginovLinten, DimitriDimitriLintenParvais, BertrandBertrandParvaisKaczer, BenBenKaczerRadu, IulianaIulianaRadu2021-11-222021-11-022021-11-2220201541-7026WOS:000612717200019https://imec-publications.be/handle/20.500.12860/38224Reliability and Variability of Advanced CMOS Devices at Cryogenic TemperaturesProceedings paper978-1-7281-3199-3WOS:000612717200019