Sensitivity based statistical analysis of circuit parameters obtained from a quasi-TEM analysis of multiconductor transmission lines

Laermans, EricEricLaermansOlyslager, FrankFrankOlyslagerDe Zutter, DanielDanielDe Zutter2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1979Sensitivity based statistical analysis of circuit parameters obtained from a quasi-TEM analysis of multiconductor transmission linesJournal article