Beyne, SofieSofieBeyneCroes, KristofKristofCroesVarela Pedreira, OlallaOlallaVarela PedreiraArnoldi, LaurentLaurentArnoldivan der Veen, MarleenMarleenvan der VeenDe Wolf, IngridIngridDe WolfTokei, ZsoltZsoltTokei2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32536Low-frequency noise measurements for electromigration characterization in BEOL interconnectsProceedings paperhttps://ieeexplore.ieee.org/document/8989897