Progress towards a physical contact model for scanning spreading resistance microscopy

Eyben, PierrePierreEybenDenis, SamuelSamuelDenisClarysse, TrudoTrudoClarysseVandervorst, WilfriedWilfriedVandervorst2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6316Progress towards a physical contact model for scanning spreading resistance microscopyOral presentation