Brammertz, GuyGuyBrammertzVermang, BartBartVermangElAnzeery, HossamHossamElAnzeerySahayaraj, SylvesterSylvesterSahayarajRanjbarrizi, SamanehSamanehRanjbarriziMeuris, MarcMarcMeurisPoortmans, JefJefPoortmans2021-10-232021-10-2320160040-6090https://imec-publications.be/handle/20.500.12860/26379Fabrication and characterization of ternary Cu8SiS6 and Cu8SiSe6 thin film layers for optoelectronic applicationsJournal articlehttp://www.sciencedirect.com/science/article/pii/S0040609016305739