Why and how to adapt PID testing for bifacial modules?

Carolus, JorneJorneCarolusBreugelmans, RobbeRobbeBreugelmansTsanakas, John A.John A.Tsanakasvan der Heide, ArvidArvidvan der HeideVoroshazi, EszterEszterVoroshaziDe Ceuninck, WardWardDe CeuninckDaenen, MichaëlMichaëlDaenen2021-10-282021-10-2820201062-7995https://imec-publications.be/handle/20.500.12860/34844Why and how to adapt PID testing for bifacial modules?Journal articlehttps://doi.org/10.1002/pip.3311