ESD reliability issues in sub-micron CMOS

Mahadeva Iyer, NatarajanNatarajanMahadeva IyerVassilev, VesselinVesselinVassilevThijs, StevenStevenThijsDe Heyn, VincentVincentDe HeynDaenen, TomTomDaenenGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7849ESD reliability issues in sub-micron CMOS - trends and challengesOral presentation