Biesemans, SergeSergeBiesemansHendriks, MartonMartonHendriksKubicek, StefanStefanKubicekDe Meyer, KristinKristinDe Meyer2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2399Practical accuracy analysis of some existing effective channel length and series resistance extraction methods for MOSFET'sJournal article