Ohyama, H.H.OhyamaSimoen, EddyEddySimoenClaeys, CorCorClaeysTakakura, K.K.TakakuraMatsuoka, H.H.MatsuokaJono, T.T.JonoUemura, J.J.UemuraKishikawa, T.T.Kishikawa2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7940Radiation damage in Si photodiodes by high-temperature irradiationJournal article