Bayerl, A.A.BayerlPorti, MarcMarcPortiMartin-Martinez, JavierJavierMartin-MartinezLanza, M.M.LanzaRodriguez, RosannaRosannaRodriguezVelayudhan, V.V.VelayudhanAmat, EsteveEsteveAmatNafria, MontseMontseNafriaAymerich, X.X.AymerichGonzalez, Mireia BMireia BGonzalezSimoen, EddyEddySimoen2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22025Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscaleProceedings paper