Pantisano, LuigiLuigiPantisanoCartier, EduardEduardCartierKerber, AndreasAndreasKerberDegraeve, RobinRobinDegraeveLorenzini, MartinoMartinoLorenziniRosmeulen, MaartenMaartenRosmeulenGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7970Dynamics of threshold voltage instability in stacked high-k dielectrics: role of the interfacial oxideProceedings paper