Zhang, Cher XuanCher XuanZhangZhang, En XiaEn XiaZhangFleetwood, Daniel M.Daniel M.FleetwoodSchrimpf, Ronald D.Ronald D.SchrimpfGalloway, Kenneth F.Kenneth F.GallowaySimoen, EddyEddySimoenMitard, JeromeJeromeMitardClaeys, CorCorClaeys2021-10-192021-10-1920100018-9499https://imec-publications.be/handle/20.500.12860/18410Effects of processing and radiation bias on leakage currents in Ge pMOSFETsJournal article