On the cost-effectiveness of KGD testing for TSV-based 3D-SICs

Marinissen, Erik JanErik JanMarinissenBeyne, EricEricBeyneDupas, LucLucDupasVelenis, DimitriosDimitriosVelenis2021-10-182021-10-182009-10https://imec-publications.be/handle/20.500.12860/15828On the cost-effectiveness of KGD testing for TSV-based 3D-SICsProceedings paper