Fatermans, J.J.FatermansVan Aert, SandraSandraVan Aertden Dekker, Arnold-JanArnold-Janden Dekker2021-10-272021-10-272019-060304-3991https://imec-publications.be/handle/20.500.12860/32951The maximum a posteriori probability rule for atom column detection from HAADF STEM imagesJournal articlehttps://doi.org/10.1016/j.ultramic.2019.02.003