Härtler, G.G.HärtlerGolze, U.U.GolzeSikula, J.J.SikulaHruska, P.P.HruskaVasina, PetrPetrVasinaClaeys, CorCorClaeysSimoen, EddyEddySimoen2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1921Transition intensities and noise spectra in submicron MOSFETsProceedings paper