Parameter extraction, variability analysis and yield prediction of the photonic integrated circuits

Khan, Muhammad UmarMuhammad UmarKhanXing, YufeiYufeiXingBogaerts, WimWimBogaerts2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33285Parameter extraction, variability analysis and yield prediction of the photonic integrated circuitsProceedings paperhttps://www.osapublishing.org/abstract.cfm?uri=IPRSN-2019-IM3A.2