Zhao, S. E.S. E.ZhaoPutcha, VamsiVamsiPutchaBury, ErikErikBuryFranco, JacopoJacopoFrancoWalke, AmeyAmeyWalkePeralagu, UthayasankaranUthayasankaranPeralaguZhao, MingMingZhaoAlian, AliRezaAliRezaAlianKaczer, BenBenKaczerWaldron, NiamhNiamhWaldronLinten, DimitriDimitriLintenParvais, BertrandBertrandParvaisCollaert, NadineNadineCollaert2021-11-232021-11-022021-11-2320201541-7026WOS:000612717200120https://imec-publications.be/handle/20.500.12860/38212Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applicationsProceedings paper978-1-7281-3199-3WOS:000612717200120DEGRADATION