Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics

Toledano Luque, MariaMariaToledano LuqueDegraeve, RobinRobinDegraeveZahid, MohammedMohammedZahidKaczer, BenBenKaczerBlomme, PieterPieterBlommeKittl, JorgeJorgeKittlJurczak, GosiaGosiaJurczakVan Houdt, JanJanVan HoudtGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920110018-9383https://imec-publications.be/handle/20.500.12860/19895Fast VTH transients after the program/erase of flash memory stacks with high-k dielectricsJournal article