Combined atomic force microscope and acoustic wave devices: application to electrodeposition

Friedt, Jean-MichelJean-MichelFriedtFrancis, LaurentLaurentFrancisChoi, Kang-HoonKang-HoonChoiFrederix, FilipFilipFrederixCampitelli, AndrewAndrewCampitelli2021-10-152021-10-152003-07https://imec-publications.be/handle/20.500.12860/7589Combined atomic force microscope and acoustic wave devices: application to electrodepositionJournal article