Vandenberghe, S.S.VandenbergheSchreurs, DominiqueDominiqueSchreursCarchon, GeertGeertCarchonNauwelaers, BartBartNauwelaersDe Raedt, WalterWalterDe Raedt2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5769Characteristic impedance extraction using calibration comparisonJournal article