Simoen, EddyEddySimoenClaeys, CorCorClaeysCzerwinski, A.A.CzerwinskiTomaszewski, D.D.TomaszewskiGibki, J.J.GibkiBakowski, A.A.BakowskiKatcki, J.J.Katcki2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2144Extraction of accurate lifetime and doping profiles in Si p-n junction diodesMeeting abstract