Ultimate scaling of CMOS logic devices with Ge and III-V materials

Heyns, MarcMarcHeynsTsai, WilmanWilmanTsai2021-10-172021-10-1720090883-7694https://imec-publications.be/handle/20.500.12860/15477Ultimate scaling of CMOS logic devices with Ge and III-V materialsJournal article