Verleysen, EvelineEvelineVerleysenBender, HugoHugoBenderRichard, OlivierOlivierRichardSchryvers, DominiqueDominiqueSchryversVandervorst, WilfriedWilfriedVandervorst2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/18277Characterization of nickel-silicides by HAADF-STEM imagingProceedings paper