Criel, StevenStevenCrielHaelvoet, KurtKurtHaelvoetMartens, LucLucMartensDe Zutter, DanielDanielDe ZutterFranchois, AnnAnnFranchoisDe Smedt, R.R.De SmedtDe Langhe, PascalPascalDe Langhe2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/573Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structuresProceedings paper