Rotondaro, AntonioAntonioRotondaroVandamme, EwoutEwoutVandammeVanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenHeyns, MarcMarcHeynsClaeys, C.C.Claeys2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1441The impact of Fe and Cu contamination in the 1012 at/cm2 range on the performance of junction diodesProceedings paper