Franco, JacopoJacopoFrancoKaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueRoussel, PhilippePhilippeRousselRagnarsson, Lars-AkeLars-AkeRagnarssonEneman, GeertGeertEnemanGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18928Impact of body bias on nanoscaled MOSFETs with individual trapped gate oxide chargesProceedings paper