Accurate measurement and characterization of reciprocal 3-ports, application to CPW T-junctions in thin-film multi-layer MCM-D

Carchon, GeertGeertCarchonDe Raedt, WalterWalterDe RaedtNauwelaers, BartBartNauwelaers2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4170Accurate measurement and characterization of reciprocal 3-ports, application to CPW T-junctions in thin-film multi-layer MCM-DProceedings paper