Time-dependent variation: A new defect-based prediction methodology

Duan, M.M.DuanZhang, J. F.J. F.ZhangJi, Z.Z.JiZhang, W.W.ZhangKaczer, BenBenKaczerSchram, TomTomSchramRitzenthaler, RomainRomainRitzenthalerThean, AaronAaronTheanGroeseneken, GuidoGuidoGroesenekenAsenov, A.A.Asenov2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23775Time-dependent variation: A new defect-based prediction methodologyProceedings paperhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6894373