Mavroidis, C.C.MavroidisHarris, J. J.J. J.HarrisLee, K.K.LeeHarrison, I.I.HarrisonAnsell, B. J.B. J.AnsellBougrioua, ZahiaZahiaBougriouaMoerman, IngridIngridMoerman2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5472Simultaneous impurity-band and interface conduction in depth-profiled n-GaN epilayersJournal article